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Joachim Würfl
Ferdinand-Braun-Institut
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5.3.2021 Analysis of GaN-HEMT DC-Characteristic Alterations by Gate Encapsulation Layer
Hossein Yazdani, Ferdinand-Braun-Institut,Serguei Chevtchenko, Ferdinand-Braun-Institut,Ina Ostermay, Ferdinand-Braun-InstitutJoachim Würfl, Ferdinand-Braun-InstitutDownload Paper