Silicon carbide (SiC) semiconductor substrates are the foundation for revolutionary improvements in the cost, size, weight and performance of a broad range of military and commercial radio frequency (RF) and power switching devices. Due to the lack of a viable, native gallium nitride (GaN) substrate, semi-insulating (SI) SiC substrates are presently the substrate of choice for high power AlGaN/GaN High Electron Mobility Transistors (HEMTs) due to their near lattice-match to GaN, superior thermal conductivity and commercial availability. GaN has emerged as the technology of choice for RF power because of its superior output power capability compared to gallium arsenide. Similarly, semi-conducting (N+) SiC substrates are required for fabrication of high voltage Schottky diodes and metal oxide semiconductor field effect transistor (MOSFET) power switching devices. Critical to this realization is the availability of affordable, high quality, large diameter SI and N+ SiC substrates for production of GaN and SiC power semiconductors. SiC is unique in that bulk single crystals cannot be grown via traditional melt-based manufacturing processes such as Czochralski. Rather, a high temperature sublimation process is required. In the late 1980s, pioneering physical vapor transport research taking place at North Carolina State University ultimately led to the formation of Cree Research and subsequently the wide bandgap semiconductor industry. U.S. Department of Defense investment in wide bandgap semiconductors, since the early 1990s, has easily exceeded $1B spawning an entirely new industry. The early days of SiC physical vapor transport growth research were fraught with perceived insurmountable technical challenges associated with micropipes, doping, polytype conversion, diameter expansion and crystalline defects. Despite this monumental crystal growth, technology hurdles, SiC substrates are presently manufactured at a cost and quality never thought possible. This paper highlights more than 20 years of AFRL sponsored development with II-VI aimed at positioning itself as a world-class manufacturer of SiC substrates.
John Blevins
Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OH
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Development of a World Class Silicon Carbide Substrate Manufacturing Capability
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14.2 Growth of Single Crystal Beta-Gallium Oxide (β-Ga2O3) Semiconductor Material
John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHDarren Thomson, Air Force Research LaboratoryKevin Stevens, Northrop Grumman SYNOPTICSGreg Foundos, Northrop Grumman SYNOPTICS -
14.3 Development of Homoepitaxial Growth of Ga2O3 by Hydride Vapor Phase Epitaxy
Jacob Leach, Kyma Technologies, Inc.Kevin Udwary, Kyma TechnologiesTom Schneider, Kyma Technologies, Inc.John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHKeith Evans, Kyma Technologies, Inc.Greg Foundos, Northrop Grumman SYNOPTICSKevin Stevens, Northrop Grumman SYNOPTICS -
14.4 Device Development of Gallium Oxide MOSFETs Grown by MOVPE on Native Substrates for High-Voltage Applications
Neil Moser A., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,Kelson Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew Green, Air Force Research Laboratory, Sensors DirectorateDennis Walker, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAStephen Tetlak, AFRLEric Heller, AFRLAntonio Crespo, Air Force Research Laboratory, Sensors DirectorateRobert Fitch, AFRLJonathan McCandless, AFRLKevin Leedy, Air Force Research Laboratory, Sensors DirectorateMichele Baldini, Leibniz-Institut für KristallzüchtungGuenter Wagner, Leibniz-Institut für KristallzüchtungGlen Via, AFRLJohn Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHGregg Jessen, AFRL -
13.5 Growth of 50mm Beta-Gallium Oxide (β-Ga2O3) Substrates
John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OH -
7a.1 Developing a New Thermal Paradigm for Gallium Nitride (GaN) Device Technology
John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHGlen Via, AFRLA. Bar-Cohen, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen HamiltonA Sivananthan, Booz-Allen-Hamilton -
May 12, 2022 // 2:50pm
16.5 Manufacturing Challenges of Czochralski Growth and Fabrication of 2-inch Semi-Insulating Beta Gallium Oxide Substrates
John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHG. Foundos, Northrop-Grumman SYNOPTICS, Charlotte, NCV, Gambin, Northrop-Grumman (AS), Redondo Beach, CAW. Everson, Penn State University, PA,C. Scott, Northrop-Grumman SYNOPTICS, Charlotte, NCD. Synder, Penn State UniversityA. Brady, Northrop-Grumman SYNOPTICS, Charlotte, NCDownload PaperLoading... -
May 12, 2022 // 1:20pm
17.1 Manufacturing Expansion of COVID-19 Foam Testing Swabs
John Blevins, Air Force Research Laboratory (AFRL), Wright-Patterson AFB, OHScott Wellman, Puritan Medical Products, Guilford, MEDownload PaperInvited Presentation
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