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Nicholas P. Sepelak
KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
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May 10, 2022 // 4:50pm
4.3 Transfer of the AFRL 0.14 μm AlGaN/GaN-on-SiC MMIC Process to MACOM’s Commercial Fab
G. Cueva, MACOME. Werner, KBR, Wright-Patterson AFBA. Islam, Air Force Research LaboratoryN. Miller, Air Force Research LaboratoryA. Crespo, Air Force Research Laboratory, Sensors DirectorateNicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAD. Walker Jr., Air Force Research LaboratoryGary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OHR. Fitch, Air Force Research LaboratoryK. Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew Green, Air Force Research Laboratory, Sensors DirectorateKyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USADownload Paper -
May 11, 2022 // 11:40am
8.3 Device Figure of Merit Performance of Scaled Gamma-Gate β-Ga2O3 MOSFETs
Kyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAAhmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAJeremiah Williams, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USADennis Walker, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USANeil Moser A., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,Kelson Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew Green, Air Force Research Laboratory, Sensors DirectorateDaniel M. Dryden, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USANicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USADownload PaperLoading... -
7.3.2023 Scaled ?-Ga2O3 MOSFETs with Pulsed Laser Deposition-Regrown Ohmics
Daniel M. Dryden, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAHyung Min Jeon, KBR Inc.,Kyle Liddy, Air Force Research LaboratoryAhmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USADennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,Jeremiah C. Williams, Air Force Research Laboratory, Sensors DirectorateNicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USANolan S. Hendricks, Air Force Research Laboratory, Sensors DirectorateKevin Leedy, Air Force Research Laboratory, Sensors DirectorateKelson Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH, -
12.2.2023 High Temperature Studies of 140 nm T-gate AlGaN/GaN HEMT Devices
Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAAdam Miesle, KBR Inc.Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAHanwool Lee, KBR Inc.Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,N. Miller, Air Force Research LaboratoryMatt Grupen, Air Force Research Laboratory, Sensors DirectorateKyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAAntonio Crespo, Air Force Research Laboratory, Sensors DirectorateGary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OHWenjuan Zhu, University of Illinois, UrbanaKelson Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,