P. Fay

University of Notre Dame

  • 5.5.2021 Temperature Dependent Measurement of GaN Impact Ionization Coefficients

    L. Cao, University of Notre Dame
    Z. Zhu, University of Notre Dame
    G. Harden, University of Notre Dame
    H. Ye, University of Notre Dame
    J. Wang, University of Notre Dame
    A. Hoffman, University of Notre Dame
    P. Fay, University of Notre Dame
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  • 8.1.2.2024 Design, Fabrication, and Characterization of GaN-Based Single Drift Region IMPATT Diodes

    Z. Zhu, University of Notre Dame
    Lina Cao, Keysight Technologies
    Yu Duan, University of Notre Dame
    Wesley Turner, University of Notre Dame
    Jinqiao Xie, Qorvo Inc
    Patrick Fay, University of Notre Dame
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