P. Seekell

MEC, BAE Systems, IQE

  • The First 0.2um 6-Inch GaN-on-SiC MMIC Process

    R. Isaak, MEC, BAE Systems, IQE
    J. Diaz, MEC, BAE Systems, IQE
    M. Gerlach, MEC, BAE Systems, IQE
    J. Hulse, MEC, BAE Systems, IQE
    L. Schlesinger, MEC, BAE Systems, IQE
    P. Seekell, MEC, BAE Systems, IQE
    W. Zhu, MEC, BAE Systems, IQE
    W. Kopp, MEC, BAE Systems, IQE
    X. Yang, MEC, BAE Systems, IQE
    A. Stewart, MEC, BAE Systems, IQE
    K. Chu, MEC, BAE Systems, IQE
    P. C. Chao, MEC, BAE Systems, IQE
    X. Gao, MEC, BAE Systems, IQE
    M. Pan, MEC, BAE Systems, IQE
    D. Gorka, MEC, BAE Systems, IQE
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