Xing Lu

Hong Kong University of Science and Technology

  • High Performance Self-aligned AlN-GaN MISHEMT with In-situSiNxGate Dielectric and Regrown Source-Drain

    Xing Lu, Hong Kong University of Science and Technology
    Jun Ma, Hong Kong University of Science and Technology
    Peiqiang Xu, Hong Kong University of Science and Technology
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  • 11.1 Suppression of Current Collapse in AlGaN/GaN MISHEMTs using in-situ SiN Gate Dielectric and PECVD SiN Passivation

    Huaxing Jiang, Hong Kong University of Science and Technology
    Chao Liu, Hong Kong University of Science and Technology
    Xing Lu, Hong Kong University of Science and Technology
    Kei May Lau, Hong Kong University of Science and Technology
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  • 11.3 Investigation of the Interface Traps and Current Collapse in LPCVD SiNx/AlGaN/GaN MISHEMTs

    Kun Yu, Xi’an Jiaotong University
    Chao Liu, Hong Kong University of Science and Technology
    Huaxing Jiang, Hong Kong University of Science and Technology
    Xing Lu, Hong Kong University of Science and Technology
    Kei May Lau, Hong Kong University of Science and Technology
    Anping Zhang, Xi'an Jiaotong University
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