Gary Hughes

Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
  • April 30, 2019 // 4:40pm – 5:00pm

    5.4 Addressing 0.25 um T-Gate Lithography Defects through Data Driven Fit Model Analysis

    Kai Shin, Northrop Grumman Corporation
    Brittany Janis, Northrop Grumman Corporation
    John Mason, Northrop Grumman Corporation
    Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
    Christopher Ridpath, Northrop Grumman Corporation
    Megan Snook, Northrop Grumman Corporation
    Aditya Gupta, Northrop Grumman Corporation
    H. George Henry, Northrop Grumman Corporation
    David Lawson, Northrop Grumman Corporation
    Jim Arnold, Northrop Grumman Corporation
    Download Paper
  • May 10, 2022 // 4:50pm

    4.3 Transfer of the AFRL 0.14 μm AlGaN/GaN-on-SiC MMIC Process to MACOM’s Commercial Fab

    G. Cueva, MACOM
    E. Werner, KBR, Wright-Patterson AFB
    A. Islam, Air Force Research Laboratory
    N. Miller, Air Force Research Laboratory
    A. Crespo, Air Force Research Laboratory, Sensors Directorate
    Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    D. Walker Jr., Air Force Research Laboratory
    Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
    R. Fitch, Air Force Research Laboratory
    K. Chabak, Air Force Research Laboratory, Sensors Directorate
    Andrew Green, Air Force Research Laboratory, Sensors Directorate
    Kyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
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  • May 11, 2022 // 2:40pm

    10.3 Optimization of GaN RF Switch Device Performance using AFRL GaN140 MMIC Process

    Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
    E. Werner, KBR, Wright-Patterson AFB
    Neil Moser A., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    Andrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Kelson Chabak, Air Force Research Laboratory, Sensors Directorate
    Michael Schuette, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    John L. Ebel, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
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  • 12.2.2023 High Temperature Studies of 140 nm T-gate AlGaN/GaN HEMT Devices

    Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Adam Miesle, KBR Inc.
    Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Hanwool Lee, KBR Inc.
    Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    N. Miller, Air Force Research Laboratory
    Matt Grupen, Air Force Research Laboratory, Sensors Directorate
    Kyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Antonio Crespo, Air Force Research Laboratory, Sensors Directorate
    Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
    Wenjuan Zhu, University of Illinois, Urbana
    Kelson Chabak, Air Force Research Laboratory, Sensors Directorate
    Andrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,

    12.2.2023_CSMANTECH_FinalPaper_HT_Islam_rev