O. Hilt

Ferdinand-Braun-Institut (FBH)

  • 9.3.2023 Drift Region Epitaxy Development and Characterization for High Blocking Strength and Low Specific Resistance in Vertical GaN Based Devices

    Eldad Bahat Treidel, Ferdinand-Braun-Institut (FBH)
    Frank Brunner, Ferdinand-Braun-Institut (FBH)
    Enrico Brusaterra, Ferdinand-Braun-Institut (FBH)
    Mihaela Wolf, Ferdinand-Braun-Institut (FBH)
    Andreas Thies, Ferdinand-Braun-Institut
    J. Würfl, Ferdinand-Braun-Institut (FBH)
    Oliver Hilt, Ferdinand-Braun-Institut (FBH)

    9.3.2023_Treidel

  • 4.1.4.2024 Wafer Bow Tuning with Stealth Laser Patterning for Vertical High Voltage Devices with Thick GaN Epitaxy on Sapphire Substrates

    Enrico Brusaterra, Ferdinand-Braun-Institut (FBH)
    Eldad Bahat Treidel, Ferdinand-Braun-Institut (FBH)
    Alexander Külberg, Ferdinand-Braun-Institut (FBH)
    Frank Brunner, Ferdinand-Braun-Institut (FBH)
    Mihaela Wolf, Ferdinand-Braun-Institut (FBH)
    Oliver Hilt, Ferdinand-Braun-Institut (FBH)

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2024/06/4.1.4.2024-Wafer-Bow-Tuning-with-Stealth-Laser-Patterning-for-Vertical-High-Voltage-Devices.pdf” download=”all”]

  • 11.2.1.2024 Defect Reduction and Yield Improvement of MIM Capacitors

    S. A. Chevtchenko, Ferdinand-Braun-Institut (FBH)
    I. Ostermay, Ferdinand-Braun-Institut (FBH)
    S. Troppenz, Ferdinand-Braun-Institut (FBH)
    J. Würfl, Ferdinand-Braun-Institut (FBH)
    O. Hilt, Ferdinand-Braun-Institut (FBH)

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2024/06/11.2.1.2024-Defect-Reduction-and-Yield-Improvement-of-MIM-Capacitors.pdf” download=”all”]